[ale] what exactly does a long smart hdd test do?
mike at trausch.us
mike at trausch.us
Fri May 11 19:01:12 EDT 2012
On 05/11/2012 01:41 AM, Ron Frazier (ALE) wrote:
> My problem is on the Linux side of the fence. I don't know how to do
> what I want there. I need to force the hdd to read all the sectors on
> the EXT4 main partition as well as the swap partition. Of course, I'm
> wanting to do all this nondestructively. So, I'm wondering exactly what
> a long smart test does, and whether it will accomplish my goal. It not,
> what would you recommend?
SMART does a couple of different things.
First, it keeps an error log on the device. Typically you can pull up
the last five errors, using the smartctl utility, if SMART is enabled on
the drive. Many of the BIOS firmwares out there don't support or don't
enable by default, so you can simply set your Linux distro up to enable
it at boot time by running smartctl for the drive. (See the man page
for the exact command to use.)
Secondly, it keeps stats on the drive. For example, hours on, motor
cycle counts, recovered read errors, unrecovered read errors, remapped
sectors, etc., etc.
See the attached output files from running smartctl -a on three
different drives to see what kinds of things it can tell you.
BTW, if this utility says your drive is failing (e.g., it does not say
“SMART overall-health self-assessment test result: PASSED”) then you had
best believe it. SMART cannot predict all failures, but the ones it
does predict, it predicts pretty close to the time of failure. The
utility will, in that case, tell you that the drive is failing and to
back it up right bloody now. Do it.
Last time I had a drive fail it told me that the drive was going to fail
within 24 hours. It did.
SMART is good. Not perfect, but good.
--- Mike
--
A man who reasons deliberately, manages it better after studying Logic
than he could before, if he is sincere about it and has common sense.
--- Carveth Read, “Logic”
-------------- next part --------------
smartctl 5.42 2011-10-20 r3458 [x86_64-linux-3.2.12-gentoo] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Deskstar 5K3000
Device Model: Hitachi HDS5C3020ALA632
Serial Number: ML0220F31HR04D
LU WWN Device Id: 5 000cca 369d53bac
Firmware Version: ML6OA5C0
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Fri May 11 18:53:09 2012 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (22796) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 134 134 054 Pre-fail Offline - 101
3 Spin_Up_Time 0x0007 100 100 024 Pre-fail Always - 325
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 9
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 144 144 020 Pre-fail Offline - 30
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 2491
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 9
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 15
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 15
194 Temperature_Celsius 0x0002 166 166 000 Old_age Always - 36 (Min/Max 20/39)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
-------------- next part --------------
smartctl 5.42 2011-10-20 r3458 [x86_64-linux-3.2.12-gentoo] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Seagate Momentus 7200.4
Device Model: ST9500420AS
Serial Number: 5VJ0LR8K
LU WWN Device Id: 5 000c50 0182c4a90
Firmware Version: 0002SDM1
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Fri May 11 18:54:26 2012 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x73) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 113) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x103f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 117 099 006 Pre-fail Always - 159552026
3 Spin_Up_Time 0x0003 098 097 085 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 445
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 1
7 Seek_Error_Rate 0x000f 067 060 030 Pre-fail Always - 8601439582
9 Power_On_Hours 0x0032 098 098 000 Old_age Always - 2356
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 037 020 Old_age Always - 401
184 End-to-End_Error 0x0032 100 100 099 Old_age Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
188 Command_Timeout 0x0032 100 098 000 Old_age Always - 166
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 068 038 045 Old_age Always In_the_past 32 (5 178 36 22 0)
191 G-Sense_Error_Rate 0x0032 090 090 000 Old_age Always - 21339
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 1
193 Load_Cycle_Count 0x0032 023 023 000 Old_age Always - 155209
194 Temperature_Celsius 0x0022 032 062 000 Old_age Always - 32 (0 20 0 0 0)
195 Hardware_ECC_Recovered 0x001a 045 043 000 Old_age Always - 159552026
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
240 Head_Flying_Hours 0x0000 100 253 000 Old_age Offline - 280933810833077
241 Total_LBAs_Written 0x0000 100 253 000 Old_age Offline - 2012121040
242 Total_LBAs_Read 0x0000 100 253 000 Old_age Offline - 1025753836
254 Free_Fall_Sensor 0x0032 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
-------------- next part --------------
smartctl 5.42 2011-10-20 r3458 [x86_64-linux-3.2.12-gentoo] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda ES.2
Device Model: ST3750330NS
Serial Number: 9QK0VNW2
LU WWN Device Id: 5 000c50 00d59973d
Firmware Version: SN06
User Capacity: 750,156,374,016 bytes [750 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Fri May 11 18:55:59 2012 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 634) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 168) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x103d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 076 059 044 Pre-fail Always - 169795672
3 Spin_Up_Time 0x0003 099 099 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 11
5 Reallocated_Sector_Ct 0x0033 098 098 036 Pre-fail Always - 50
7 Seek_Error_Rate 0x000f 062 060 030 Pre-fail Always - 1698929
9 Power_On_Hours 0x0032 086 086 000 Old_age Always - 12893
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 20
184 End-to-End_Error 0x0032 100 100 099 Old_age Always - 0
187 Reported_Uncorrect 0x0032 040 040 000 Old_age Always - 60
188 Command_Timeout 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 076 063 045 Old_age Always - 24 (Min/Max 24/24)
194 Temperature_Celsius 0x0022 024 040 000 Old_age Always - 24 (0 18 0 0 0)
195 Hardware_ECC_Recovered 0x001a 049 045 000 Old_age Always - 169795672
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 7 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 7 occurred at disk power-on lifetime: 12879 hours (536 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 f8 ff ff ff 4f 00 17:56:16.404 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 17:56:16.403 READ FPDMA QUEUED
ea 00 00 00 00 00 a0 00 17:56:16.387 FLUSH CACHE EXT
60 00 08 ff ff ff 4f 00 17:56:16.343 READ FPDMA QUEUED
60 00 88 ff ff ff 4f 00 17:56:14.133 READ FPDMA QUEUED
Error 6 occurred at disk power-on lifetime: 12879 hours (536 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 00 ff ff ff 4f 00 17:55:41.595 READ FPDMA QUEUED
27 00 00 00 00 00 e0 00 17:55:41.568 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 00 17:55:41.566 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 17:55:41.553 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 00 17:55:41.525 READ NATIVE MAX ADDRESS EXT
Error 5 occurred at disk power-on lifetime: 12879 hours (536 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 00 ff ff ff 4f 00 17:55:36.931 READ FPDMA QUEUED
27 00 00 00 00 00 e0 00 17:55:36.903 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 00 17:55:36.902 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 17:55:36.888 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 00 17:55:36.861 READ NATIVE MAX ADDRESS EXT
Error 4 occurred at disk power-on lifetime: 12879 hours (536 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 00 ff ff ff 4f 00 17:55:32.230 READ FPDMA QUEUED
27 00 00 00 00 00 e0 00 17:55:32.181 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 00 17:55:32.179 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 17:55:32.166 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 00 17:55:32.138 READ NATIVE MAX ADDRESS EXT
Error 3 occurred at disk power-on lifetime: 12879 hours (536 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 00 ff ff ff 4f 00 17:55:27.596 READ FPDMA QUEUED
27 00 00 00 00 00 e0 00 17:55:27.516 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 00 17:55:27.514 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 17:55:27.501 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 00 17:55:27.474 READ NATIVE MAX ADDRESS EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
-------------- next part --------------
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